{"id":1750,"date":"2023-11-13T17:38:12","date_gmt":"2023-11-13T09:38:12","guid":{"rendered":"https:\/\/aiportek.com\/?page_id=1750"},"modified":"2024-07-10T14:29:13","modified_gmt":"2024-07-10T06:29:13","slug":"baby-lin-ii","status":"publish","type":"page","link":"https:\/\/aiportek.com\/en\/linbus\/baby-lin-ii\/","title":{"rendered":"Baby-LIN-II-ENG"},"content":{"rendered":"
\n\t\t\t\t
\n\t\t
\n\t\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t

Baby-LIN-II<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t
\n\t\t\t\t\t
\n\t\t
\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\"\"\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t
\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t

Baby-LIN-II<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t
\n\t\t\t\n\t\t\t\t\t\t<\/span>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t

\u00a0<\/span>Function Overview:<\/span><\/p>

    • Professional LIN bus test tool that can emulate one LIN master node and multiple slave nodes at the same time. Fully compatible with the Baby-LIN-E06 generation and more powerful.<\/li>
    • Small but powerful system for controlling the LIN bus via USB. Emulates LIN master or LIN slave nodes. Isolated LIN interface to avoid ambient noise.<\/li>
    • The device also supports stand-alone use without a computer. Thus the durability test sequence can be defined as macros and the connection to the LIN bus is automatically activated without the need for a computer.<\/li>
    • PC software development based on DLLs, with secondary development routines for C#, Visual C, Visual Basic and LabView.<\/li>
    • Supports WINXP, VISTA, WIN7 (32\/64 Bit) and WIN8 (32\/64 Bit) and Linux.<\/li><\/ul><\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
      \n\t\t\t\t\t\t
      \n\t\t\t\t\t
      \n\t\t\t
      \n\t\t\t\t\t\t
      \n\t\t\t\t\t\t
      \n\t\t\t\t\t
      \n\t\t\t
      \n\t\t\t\t\t\t
      \n\t\t\t\t
      \n\t\t\t\t\t
      \n
      \n
        \n
      • \n \n \n \n Main Applications<\/span> <\/li>\n
      • \n \n \n \n Key Specifications<\/span> <\/li>\n
      • \n \n \n \n Contents and Specifications<\/span> <\/li>\n <\/ul>\n <\/div>\n \n
        \n\t\t \n
        \n\t\t\t\t
        • Local monitoring, real-time reading, recording, sending and displaying of LIN data.<\/li>
        • Supports LIN device diagnostics and DTL (Diagnostic Transport Layer) such as 3C\/3D services.<\/li>
        • Local modification and testing of all control parameters, message signals, frame timing, program timing<\/li>
        • The Baby-LIN-II LIN bus transceiver supports baud rates up to 200K. Although standard LIN devices support up to 20K, there are a growing number of high-speed LIN devices that exceed 20K communication rates, use non-LIN standard protocols, or are swiping a node at a higher baud rate, and require a supporting device to monitor and communicate. Baby-LIN-II can realize these applications in ASCII-Mode.<\/li>
        • One price covers the functionality of many devices on the market: such as LIN Bus Emulator, LIN Bus Diagnostic, LIN Bus Tester, LIN Bus Analyzer, LIN Bus Adapter, etc...<\/li>
        • Master-slave simulation and analysis of LIN nodes\/systems to simulate bus participants that do not actually exist. For example, it simulates ECUs and other outgoing data, and supports virtual simulation, semi-physical simulation, and \"listen-only\" mode.<\/li>
        • Supports event-based signal configuration, sequence control, error determination, and triggering actions.<\/li>
        • Trigger actions to be performed (e.g. run or stop, send another message, change a signal value, etc.) by various event triggering conditions (signal events, message frame events, changed events, etc.)<\/li>
        • Signal events include the result of comparison between signal values, the result of comparison between signal values and constants, and the range of signal changes.<\/li>
        • Frame events include selected frames appearing on the bus, errors in frames (e.g. checks and errors, nodes not responding, etc.)<\/li>
        • Changed events include a change in a signal value, or a change in a message frame.<\/li>
        • Typical tests include: for example, when the product under test has an abnormality, detecting the error through LIN telegrams and stopping the equipment or triggering the sending of a certain command by Baby-LIN-II; for example, after a fixed period of time, starting the cycle of testing for 8,000 times: forward and backward rotation, start-up operation, different angles of openness, etc.; for example, when the production line workers activate Baby-LIN-II. For example, a production line worker activates the Baby-LIN-II module to automatically complete a series of tests before the product is shipped out of the factory: from startup to running to stopping the continuous test.<\/li><\/ul> <\/div>\n\t\t \n
          \n\t\t\t\t